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Variation of GaN Valence Bands with Biaxial Stress: Quantification of Residual Stress and Impact on Fundamental Band Parameters

Author(s):
Edwards, N. V.
Yoo, S. D.
Bremser, M. D.
Horton, M. N.
Perkins, N. R.
Weeks, T. W., Jr.
Liu, H.
Stall, R. A.
Kuech, T. F.
Davis, R. F.
Aspnes, D. E.
6 more
Publication title:
III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
449
Pub. Year:
1997
Page(from):
781
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993532 [1558993533]
Language:
English
Call no.:
M23500/449
Type:
Conference Proceedings

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