Structural and Optical Characterization of High-Quality Cubic GaN Epilayers Grown on GaAs and 3C-SiC Substrates by Gas-Source MBE Using RHEED In Situ Monitoring | 東京工業大学附属図書館文献データベース

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Structural and Optical Characterization of High-Quality Cubic GaN Epilayers Grown on GaAs and 3C-SiC Substrates by Gas-Source MBE Using RHEED In Situ Monitoring

Author(s):

Balakrishnan, K.

Publication title:

III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

449

Pub. Year:

1997

Page(from):

435

Pub. info.:

Pittsburgh, PA: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993532 [1558993533]

Language:

English

Call no.:

M23500/449

Type:

Conference Proceedings

Details

TDL ID:	ZA00017523
Series ID:	PA00000011
Conf. info. (Name):	Symposium on III-V nitrides
Conf. info. (Number):	1996
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1996.12.02-1996.12.06

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