30 Years of Electromigration Research: A Grand Masters' Perspective

30 Years of Electromigration Research: A Grand Masters' Perspective

Author(s):: Lloyd, J. R.
Publication title:: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Title of ser.:: Materials Research Society symposium proceedings
Ser. no.:: 428
Pub. Year:: 1996
Page(from):: 3
Pub. info.:: Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:: 02729172
ISBN:: 9781558993310 [1558993312]
Language:: English
Call no.:: M23500/428
Type:: Conference Proceedings

Details

TDL ID:	ZA00017521
Series ID:	PA00000011
Conf. info. (Name):	Symposium on materials reliability in microelectronics
Conf. info. (Number):	6th
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1996.04.08-1996.04.12

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