Blank Cover Image

Sub-Feature Speckle Interferometry: A New Approach to Temperature Measurement

Author(s):
Publication title:
Rapid thermal and integrated processing IV : symposium held April 17-20, 1995, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
387
Pub. Year:
1995
Page(from):
125
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992900 [1558992901]
Language:
English
Call no.:
M23500/387
Type:
Conference Proceedings

Similar Items:

Burckel, D., Zaidi, S. H., Lang, M. K., Frauenglass, A., Brueck, S. R. J.

MRS - Materials Research Society

Zaidi,S.H., Gee,J.M., Ruby,D.S., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering

Zaidi, S.H., Chu, A-S., Brueck, S.R.J.

Electrochemical Society

Zaidi,S.H., Brueck,S.R.J., Hill,T.A., Shagam,R.N.

SPIE-The International Society for Optical Engineering

Zaidi,S.H., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering

9 Conference Proceedings Image reversal at nanometer scales

Zaidi,S.H., Chen,X., Brueck,S.R.J.

SPIE-The International Society for Optical Engineering

Zaidi,S.H., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering

Millerd,J.E., Trolinger,J.D., Vikram,C.S., Pechersky,M.J.

SPIE-The International Society for Optical Engineering

Zaidi,S.H., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering

R. Höfling, V. Liebig, C.-D. Schmidt

Society of Photo-optical Instrumentation Engineers

Zaidi, Saleem H., Chu, An-Shyang, Brueck, S. R. J.

MRS - Materials Research Society

G. Scheuring, S. Doebereiner, F. Hillmann, G. Falk, H. Brueck

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12