Compensation method of antiferroelectric liquid crystal device characteristic variation caused by temperature changing

Compensation method of antiferroelectric liquid crystal device characteristic variation caused by temperature changing

Author(s):

Zhao,W. ( Changchun Institute of Physics )
Sun,R.
Guo,J.
Huang,X.

Publication title:

Display devices and systems : 6-7 November 1996, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2892

Pub. Year:

1996

Page(from):

172

Page(to):

177

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819422934 [0819422932]

Language:

English

Call no.:

P63600/2892

Type:

Conference Proceedings

Details

TDL ID:	ZA00017496
Series ID:	PA00000029
Conf. info. (Name):	Photonics China : Display devices and systems
Conf. info. (Number):	1996
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	1996.11.06-1996.11.07

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