Near-field calculations of the electromagnetic field in a metallic sample illuminated by a metallized nano-source

Near-field calculations of the electromagnetic field in a metallic sample illuminated by a metallized nano-source

Author(s):

Barchiesi,D. ( Univ.de Franche-Comte )
Belmar-Letelier,L.
Labeke,D.Van

Publication title:

Optical Inspection and Micromeasurements

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2782

Pub. Year:

1996

Page(from):

794

Page(to):

804

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421685 [0819421685]

Language:

English

Call no.:

P63600/2782

Type:

Conference Proceedings

Details

TDL ID:	ZA00017485
Series ID:	PA00000029
Conf. info. (Name):	Lasers, Optics, and Vision for Productivity in Manufacturing : Optical Inspection and Micromeasurements
Conf. info. (Number):	1996
Conf. info. (Venue):	Besancon, France
Conf. info. (Date):	1996.06.10-1996.06.14

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