High-speed two-dimensional fringe analysis using frequency demodultion

High-speed two-dimensional fringe analysis using frequency demodultion

Author(s):

Publication title:

Optical Inspection and Micromeasurements

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2782

Pub. Year:

1996

Page(from):

377

Page(to):

384

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421685 [0819421685]

Language:

English

Call no.:

P63600/2782

Type:

Conference Proceedings

Details

TDL ID:	ZA00017485
Series ID:	PA00000029
Conf. info. (Name):	Lasers, Optics, and Vision for Productivity in Manufacturing : Optical Inspection and Micromeasurements
Conf. info. (Number):	1996
Conf. info. (Venue):	Besancon, France
Conf. info. (Date):	1996.06.10-1996.06.14

Similar Items:

1 Conference Proceedings High-speed fringe analysis method using frequency demodulation technology Y. Arai, S. Yokozeki, T. Yamada Society of Photo-optical Instrumentation Engineers	7 Conference Proceedings Development of fringe analysis method for image in ESPI using single sheet of specklegram [5880-04] Arai, Y., Yokozeki, S. SPIE - The International Society of Optical Engineering
2 Conference Proceedings Experimental modal analysis for vibration with large amplitude using moire topography Arai,Y., Yokozeki,S., Shiraki,K. SPIE-The International Society for Optical Engineering	8 Conference Proceedings Spatial fringe analysis method in ESPI Arai,Y., Yokozeki,S. SPIE - The International Society for Optical Engineering
3 Conference Proceedings Investigation using communication theory in spatial fringe analysis method Arai, Y., Yokozeki, S. SPIE-The International Society for Optical Engineering	9 Conference Proceedings Composition of virtual speckle pattern for spatial fringe analysis method in ESPI by using single camera Y. Arai, R. Shimamura, S. Yokozeki SPIE - The International Society of Optical Engineering
4 Conference Proceedings In-plane displacement measurement using ESPI based on spatial fringe analysis method Arai, Y., Yokozeki, S. SPIE-The International Society for Optical Engineering	10 Conference Proceedings Electronic speckle pattern interferometry based on spatial fringe analysis method Arai,Y., Yokozeki,S. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Using a sheet of specklegram: the development of fringe analysis method for ESPI Arai, Y., Yokozeki, S. SPIE - The International Society of Optical Engineering	11 Conference Proceedings High resolution deformation measurement method using one sheet of specklegram [6292-50] Arai, Y., Yokozeki, S. SPIE - The International Society of Optical Engineering
6 Conference Proceedings Electric speckle pattern interferometry based on spatial fringe analysis method using multicamera [6341-20] Arai, Y., Yokozeki, S. SPIE - The International Society of Optical Engineering	12 Conference Proceedings Control of phase of fringes in speckle interferometry for application of fringe scanning methods Arai, Y., Yokozeki, S. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12