Blank Cover Image

Double spectral modulation for surface analysis

Author(s):
Publication title:
Optical Inspection and Micromeasurements
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2782
Pub. Year:
1996
Page(from):
38
Page(to):
46
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421685 [0819421685]
Language:
English
Call no.:
P63600/2782
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Optical implementation of frequency domain analysis for white-light interferometry

P. Sandoz, H. Perrin, G.M. Tribillon, J.E. Calatroni, A.L. Guerrero

Society of Photo-optical Instrumentation Engineers
7 Conference Proceedings Real-time dispersion curve measurement from spectrally resolved white-light interferometry

Calatroni,J.E., Sainz,C., Guerrero,A.L.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings White light interferometry:innovative algorithms and performances

Sandoz,P., Calatroni,J.E., Tribillon,G.M.

SPIE - The International Society for Optical Engineering
8 Conference Proceedings Fluorescent sol-gel layer for optical cryogenic temperature sensor

S. Bertrand, F. Bresson, G.M. Tribillon, P. Audebert

Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings Profilometry by spectral encoding of the optical axis

H. Perrin, P. Sandoz, C.M. Tribillon

Society of Photo-optical Instrumentation Engineers
9 Conference Proceedings Stationary phase in spectrally resolved white light interferometry (SRWLI) as a refractometry tool

Calatroni, J.E., Sainz, C., Escalona, R.A.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Surface profilometry in the spectral domain

Calatroni,J.E., Sainz,C., Guerrero,A.L., Escalona,R.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Measurement of both sample width and differential refractive index through spectrally resolved white light interferometry

Sainz,C., Calatroni,J.E., Escalona,R.A.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Fluorescence detection and electrochemistry in hybrid zirconia xerogels including chromophores or electroactive species

Audebert,P., Cattey,H., Bresson,F., Tribillon,G.M.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Analysis of surfaces, films, and multilayers by resonant laser ablation

T.M. Allen, C.H. Smith, P.B. Kelly, J.E. Anderson, G.C. Eiden

Society of Photo-optical Instrumentation Engineers
6 Conference Proceedings Interferometric analysis of strained thin silicon films

Trolard,B., Tribillon,G.M., Bonnotte,E., Delobelle,P., Bornier,L.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Interferometric method for characterizing the mechanical properties of thin films by bulging tests

Bonnotte,E., Robert,L., Delobelle,P., Bornier,L., Trolard,B., Tribillon,G.M., Mairey,D.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12