Blank Cover Image

Calibration of the first XMM flight mirror module, I - image quality

Author(s):
Gondoin, Ph. ( European Space Research and Technology Center, the Netherlands )
Aschenbach, B.
Beijersbergen, M.
Egger, R.
Jansen, F.
Stockman, Y.
Tock, J.P.
2 more
Publication title:
X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3444
Pub. Year:
1998
Page(from):
278
Page(to):
289
Pub. info.:
Bellingham, Wash.: SPIE
ISSN:
0277786X
ISBN:
9780819428998 [081942899X]
Language:
English
Call no.:
P63600/3444
Type:
Conference Proceedings

Similar Items:

Gondoin, Ph., Aschenbach, B., Beijersbergen, M., Egger, R., Jansen, F., Stockman, Y., Tock, J.P.

SPIE

Stockman, Y., Domken, I., Hansen, H., Tock, J. Ph., Decker, T.A., Rasmussen, A., Boggende, A.J.F. den, Herder, J.W. den, …

SPIE

Gondoin,Ph., Aschenbach,B.R., Brauninger,H.W., Chambure,D.de, Collette,J.P., Egger,R., Katwijk,K.van, Lumb,D.H., …

SPIE-The International Society for Optical Engineering

Stockman,Y., Hansen,H., Houbrechts,Y., Tock,J.-P., de Chambure,D., Gondoin,P.

SPIE - The International Society for Optical Engineering

Stockman,Y., Houbrechts,Y., Naze,Y., Rochus,P.P., Tock,J.P., Gondoin,P.

SPIE - The International Society for Optical Engineering

Stockman, Y.

ESA Publications Division

Stockman,Y., Collette,J.-P., Tock,J.-Ph., de Chambure,D., Gondoin,Ph.

SPIE-The International Society for Optical Engineering

Tock,J.-Ph., Collette,J.-P., Stockman,Y.

SPIE-The International Society for Optical Engineering

5 Conference Proceedings XMM flight model mirror module testing

Stockman,Y., Barzin,P., Hansen,H., Mazy,E., Tock,J.P., Chambure,D.de, Laine,R., Kampf,D., Banham,R., Canali,M., …

SPIE - The International Society for Optical Engineering

Chambure,D.de, Laine,R., Katwijk,K.van, Kletzkine,P., Valenzuela,A., Grisoni,G., Canali,M., Hofer,S., Tock,J.P., …

SPIE - The International Society for Optical Engineering

Stockman, Y., Domken, I., Hansen, H., Tock, J.Ph.

SPIE

Chambure,D.de, Laine,R., Katwijk,K.van, Kletzkine,P., Valenzuela,A., Grisoni,G., Canali,M., Hofer,S., Tock,J.P., …

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12