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X-ray CCD calibration for the AXAF CCD imaging spectrometer

Author(s):
Bautz, M. ( Massachusetts Institute of Technology )
Pivovaroff, M.
Baganoff, F.
Isobe, T.
Jones, S.
Kissel, S.
LaMarr, B.
Manning, H.
Prigozhin, G.
Ricker, G.
Nousek, J.
Grant, C.
Nishikida, K.
Scholze, F.
Thornagel, R.
Ulm, G.
11 more
Publication title:
X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3444
Pub. Year:
1998
Page(from):
210
Page(to):
224
Pub. info.:
Bellingham, Wash.: SPIE
ISSN:
0277786X
ISBN:
9780819428998 [081942899X]
Language:
English
Call no.:
P63600/3444
Type:
Conference Proceedings

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