Application of generalized ellipsometry to complex optical systems

Application of generalized ellipsometry to complex optical systems

Author(s):

Schubert,M. ( Univ.of Leipzig(FRG) )
Rheinlander,B. ( Univ.of Leipzig(FRG) )
Woollam,J.A. ( Univ.of Nebraska(USA) )
Johs,B.D. ( J.A.Wooltam Co.(USA) )
Herzinger,C.M. ( J.A.Wooltam Co.(USA) )

Publication title:

Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3094

Pub. Year:

1997

Page(from):

255

Page(to):

265

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425096 [0819425095]

Language:

English

Call no.:

P63600/3094

Type:

Conference Proceedings

Details

TDL ID:	ZA00017410
Series ID:	PA00000029
Conf. info. (Name):	Polarimetry and Ellipsometry
Conf. info. (Number):	1996
Conf. info. (Venue):	Kazimierz Dolny, Poland
Conf. info. (Date):	1996.05.20-1996.05.23

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