Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature

Semiconductor multiple-electrode detectors for measuring ionizing radiation at room temperature

Author(s):

Lingren,C.L. ( Digirad Corp. )

Apotovsky,B.A. ( Digirad Corp. )

Butler,J. F. ( Digirad Corp. )

Conwell,R. L. ( Digirad Corp. )

Doty,F. P. ( Digirad Corp. )

Friesenhahn,S. J. ( Digirad Corp. )

Oganesyan,A. ( Digirad Corp. )

Pi,B. ( Digirad Corp. )

Zhao,S. ( Digirad Corp. )

4 more

Publication title:

Hard X-ray and gamma-ray detector physics, optics, and applications : 31 July-1 August 1997, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3115

Pub. Year:

1997

Page(from):

336

Page(to):

340

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425379 [0819425370]

Language:

English

Call no.:

P63600/3115

Type:

Conference Proceedings

Details

TDL ID:	ZA00017408
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications
Conf. info. (Number):	1997
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.31-1997.08.01

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