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Production and characterization of x-ray speckle at Sector 8 of the advanced photon source

Author(s):
Sandy,A.R. ( Massachusetts Institute of Technology )
Lurio,L.B. ( Massachusetts Institute of Technology )
Mochrie,S.G.J. ( Massachusetts Institute of Technology )
Malik,A. ( Argonne National Lab. )
Stephenson,G.B. ( Argonne National Lab. )
Sutton,M. ( McGill Univ.(Canada) )
1 more
Publication title:
Coherent electron-beam x-ray sources : techniques and applications : 31 July-1 August 1997, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3154
Pub. Year:
1997
Page(from):
27
Page(to):
38
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425768 [0819425761]
Language:
English
Call no.:
P63600/3154
Type:
Conference Proceedings

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