Entropy-based optimal sensor location for structural damage detection

Entropy-based optimal sensor location for structural damage detection

Author(s):

Beck,J.L. ( California Institute of Technology )
Papadimtriou,C. ( California Institute of Technology )
Au,S.-K. ( California Institute of Technology )
Vanik,M.W. ( The Aerospace Corp. )

Publication title:

Smart structures and materials 1998 : Smart systems for bridges, structures, and highways : 4-5 March 1998, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3325

Pub. Year:

1998

Page(from):

161

Page(to):

172

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819427694 [0819427691]

Language:

English

Call no.:

P63600/3325

Type:

Conference Proceedings

Details

TDL ID:	ZA00017387
Series ID:	PA00000029
Conf. info. (Name):	Smart Structures and Materials
Conf. info. (Number):	1998
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1998.03.04-1998.03.05

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