Impact of excess low-frequency noise (ELFN) in Si:As impurity band conduction (IBC) focal plane arrays for astronomical applications

Impact of excess low-frequency noise (ELFN) in Si:As impurity band conduction (IBC) focal plane arrays for astronomical applications

Author(s):

Arrington,D.C. ( Ball Aerospace & Technologies Corp. )
Hubbs,J.E. ( Ball Aerospace & Technologies Corp. )
Gramer,M.E. ( Ball Aerospace & Technologies Corp. )
Dole,G.A. ( Ball Aerospace & Technologies Corp. )

Publication title:

Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3379

Pub. Year:

1998

Page(from):

361

Page(to):

370

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428288 [0819428280]

Language:

English

Call no.:

P63600/3379

Type:

Conference Proceedings

Details

TDL ID:	ZA00017382
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Infrared Detectors and Focal Plane Arrays
Conf. info. (Number):	1998 : 5th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	1998.04.14-1998.04.17

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