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Amorphous silicon imaging system for improved x-ray image capture in nondestructive evaluation

Author(s):
Publication title:
Process control and sensors for manufacturing : 31 March - 1 April 1998, San Antonio, Texas
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3399
Pub. Year:
1998
Page(from):
180
Page(to):
187
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819428486 [0819428485]
Language:
English
Call no.:
P63600/3399
Type:
Conference Proceedings

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