Bauschlicher. W. C, walch. P. S, Langhoff. R. S
D. Reidel
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Campbell, R. A., Rodriguez, J. A., Goodman, D. W.
Elsevier
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Walch, Stephen P.
National Aeronautics and Space Administration
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Giardello A. M., King A. W., Nolan P. S., Porchia M., Sishta C., Marks J. T.
Kluwer Academic Publishers
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Walch, S. P.
National Aeronautics and Space Administration
|
Jones D. W., Chin M. R., Dong L., Duckett B. S., Hessell T. E.
Kluwer Academic Publishers
|
Walch, S.P.
National Aeronautics and Space Administration
|
Allen, P.B., Beaulac, T.P., Khan, F.S., Bulter, W.H., Pinski, F.J., Swhart, J.C.
Materials Research Society
|
Walch, Stephen P.
National Aeronautics and Space Administration
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Wong, S.-P., Gao, Y., Cheng, K.H., Chow, C.F., Ke, N., Cheung, W.Y., Li, Q., Shao, G.S.
SPIE - The International Society of Optical Engineering
|
Bauschlicher, Jr. W. C., Langhoff R. S., Taykir R. P.
Kluwer Academic Publishers
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Pressel, K., Heitz, R., Eckey, L., Loa, I., Thurian, P., Hoffmann, A., Meyer, B. K., Fischer, S., Wetzel, C., Haller, E. …
MRS - Materials Research Society
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