Bonavida B., Safrit T. J., Morimoto H.
Springer-Verlag
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Festenstein Hilliard, Labeta Mario
Plenum Press
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Baldwin W. R., Embleton J. M., Pimm V. M.
PLENUN PRESS
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Masciotti, J., Abdoulaev, G., Hur, J., Papa, J., Bae, J., Huang, J., Yamashiro, D., Kandel, J., Hielscher, A. H.
SPIE - The International Society of Optical Engineering
|
Yang, M., Amoh, Y., Li, L., Baranov, E., Wang, J.W., Jiang, P., Moossa, A.R., Hoffman, R.M.
SPIE - The International Society of Optical Engineering
|
Baba, J.S., Gleason, S.S., Goddard, J.S., Paulus, M.J.
SPIE - The International Society of Optical Engineering
|
Hickman-Davis,J.M., Matalon,S., Lindsey,J.R.
IOS Press
|
A. Koenig, L. Herve, A. Da. Silva, J. -M. Dinten, J. Boutet, M. Berger, V. Josserand, J. Coll, P. Peltie, P. Rizo
SPIE - The International Society of Optical Engineering
|
Eline Boghaert, Jason P. Gleghorn, KangAe Lee, Derek C. Radisky, Celeste M. Nelson
American Institute of Chemical Engineers
|
Eckert W. J., Ratnayake M.
PLENUM PRESS
|
Eline Boghaert, Jason P. Gleghorn, KangAe Lee, Derek C. Radisky, Celeste M. Nelson
American Institute of Chemical Engineers
|
Brett Case, Benjamin J. Hackel
American Institute of Chemical Engineers
|