Viscoelastic Measurements in Thin Polystyrene Melts as Derived from Scanning Force Microscopy-Induced Nanoflow Patterns

Viscoelastic Measurements in Thin Polystyrene Melts as Derived from Scanning Force Microscopy-Induced Nanoflow Patterns

Author(s):

Publication title:

Microstructure and microtribology of polymer surfaces

Title of ser.:

ACS symposium series

Ser. no.:

741

Pub. Year:

2000

Page(from):

227

Pub. info.:

Washington, D. C.: American Chemical Society

ISSN:

00976156

ISBN:

9780841236820 [0841236828]

Language:

English

Call no.:

A05800/741

Type:

Conference Proceedings

Details

TDL ID:	ZA00017178
Series ID:	PA00000004
Conf. info. (Name):	American Chemical Society National Meeting
Conf. info. (Number):	1998
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1998.08.00

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