Radiation testing of electro-optic devices in compliance with IEEE 1156.4

Radiation testing of electro-optic devices in compliance with IEEE 1156.4

Author(s):

Greenwell,R.A. ( Science and Engineering Associates,Inc. )

Publication title:

Photonics for space and radiation environments : 20-21 September 1999, Florence, Italy

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3872

Pub. Year:

1999

Page(from):

84

Page(to):

94

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819434678 [0819434671]

Language:

English

Call no.:

P63600/3872

Type:

Conference Proceedings

Details

TDL ID:	ZA00017164
Series ID:	PA00000029
Conf. info. (Name):	SPIE Remoto Sensing : Photonics for space and radiation environments
Conf. info. (Number):	1999
Conf. info. (Venue):	Florence, Italy
Conf. info. (Date):	1999.09.20-1999.09.21

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