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Mode study of the light emission distribution in semiconductor microdisks by using near-field optical microscopy

Author(s):
Zhang,Y. ( Peking Univ. )
Zhu,X.
Dai,L.
Zhou,H.
Wang,R.
Xin,Y.
Wang,G.
Xu,S.
Shen,Y.
Zhang,B.
Zhang,G.
Gan,Z.
Song,F.
8 more
Publication title:
Near-field optics : physics, devices, and information processing : 22-23 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3791
Pub. Year:
1999
Page(from):
168
Page(to):
178
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819432773 [0819432776]
Language:
English
Call no.:
P63600/3791
Type:
Conference Proceedings

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