Noncontact laser metrology with real-time detection and high-speed processing for material analysis

Noncontact laser metrology with real-time detection and high-speed processing for material analysis

Author(s):

Zou,Y. ( Physical Optics Corp. )

Publication title:

Laser radar technology and applications V : 26-28 April 2000, Orlando, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4035

Pub. Year:

2000

Page(from):

254

Page(to):

265

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819436610 [0819436615]

Language:

English

Call no.:

P63600/4035

Type:

Conference Proceedings

Details

TDL ID:	ZA00017123
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Laser radar technology and applications
Conf. info. (Number):	2000 : 5th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2000.04.26-2000.04.28

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