Blank Cover Image

Hot Electron and Radiation Induced Degradation-Interaction in Near Micron MOS Transistor

Author(s):
Publication title:
Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999)
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3975
Pub. Year:
2000
Vol.:
Part1
Page(from):
333
Page(to):
336
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436016 [0819436011]
Language:
English
Call no.:
P63600/3975
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Electromigration Induced By Radiatoin and Hot Electron Stress:A New Interactive Damage Phenomenon in Metal Interconnection

Andhare,P.N., Nahar,R.K., Devashrayee,N.M., Wadhawan,O.P.

SPIE - The International Society for Optical Engineering
7 Conference Proceedings Preparation and Characterization of Chemically Deposited Mixed Bismuch Sulphoselenide Thin Films

Patil,A.R., Mane,R.K., Bhosale,P.N.

SPIE - The International Society for Optical Engineering
2 Conference Proceedings Development of Inverse TLDD Technique at CEERI

Andhare,P.N., Pant,B.D., Eranna,G., Virdi,G.S., Soni,R.N., Wadhawan,O.P.

SPIE - The International Society for Optical Engineering
8 Conference Proceedings Sub-Micron Thin Film Transistors with Metal Induced Lateral Crystallization

Joshi, A.R., Saraswat, K.C.

Electrochemical Society
3 Conference Proceedings Development of Poly Buffer Isolation Technology at CEERI

Andhare,P.N., Tandon,U.S., Joshi,B.C., Pathak,B.C., Chandra,S., Wadhawan,O.P.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings Relation between degradation of electrical parameters of MOS transistors by hot carrier injection and their drift due to radiation for a new rad-hardened ACMOS …

Frapreau, I., Gagnard, X.

ESA Publications Division
4 Conference Proceedings Fabrication of Micro Humidity Sensor Based On Porous Al2O3 Films

Nahar,R.K., Devashrayee,N.M., Gupta,R.P.

SPIE - The International Society for Optical Engineering
10 Conference Proceedings A Combinatorial Approach to the Development of Mollybdenum Sulphoselenide Thin Films Using Arrested Precipitation Technique (APT)

Ajalkar, B.D., Mane, R.K., Bhosale, P.N.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Radiation-Induced Degradation of Bipolar Transistors

Topkar,A., Mathew,T., Lal,R., Vasi,J., Nanver,L.

Narosa Publishing House
11 Conference Proceedings Comparative Study of Bismuth Chalcogenide Thin Films Prepared by Arrested Precipitation Technique (APT)

Mane, R.K., Ajalkar, B.D., Bhosale, P.N.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Design and Development of ALD Precursors for Microelectronics

R.K. Kanjolia, J. Anthis, R. Odedra, P. Williams, P.N. Heys

Electrochemical Society
12 Conference Proceedings Hydrogen-Induced Reversible Changes in Drain Current of Pt-Gated AlGaN/GaN High Electron Mobility Transistors (HEMT)

H. T. Wang, B. S. Kang, F. Ren, R. C. Fitch, J. K. Gillespie, N. Moser, G. Jessen, T. Jenkins, R. Dettmer, D. Via, A. …

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12