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Microstructural Studies of GaAs/Ge Interface using SEM and EDS

Author(s):
Kishore,Ram
Sood,K.N.
Sharma,S.K.
Tyagi,R.
Singh,M.
Agarwal,S.K.
1 more
Publication title:
Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999)
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3975
Pub. Year:
2000
Vol.:
Part1
Page(from):
247
Page(to):
250
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436016 [0819436011]
Language:
English
Call no.:
P63600/3975
Type:
Conference Proceedings

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