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Structural characterization using synchrotron radiation of oxide films and multilayers grown by MOCVD

Author(s):
Dubourdieu, C.
Lindner, J.
Audier, M.
Rosina, M.
Weiss, F.
Senateur, J. P.
Hodeau, J. L.
Dooryhee, E.
Berar, J. F.
4 more
Publication title:
Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
590
Pub. Year:
2000
Page(from):
219
Pub. info.:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994980 [155899498X]
Language:
English
Call no.:
M23500/590
Type:
Conference Proceedings

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