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Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution X-ray diffraction

Author(s):
Zhuang, Y.
Schelling, C.
Roch, T.
Daniel, A.
Schaffler, F.
Bauer, G.
Grenzer, J.
Pietsch, U.
Senz, S.
4 more
Publication title:
Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
590
Pub. Year:
2000
Page(from):
207
Pub. info.:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994980 [155899498X]
Language:
English
Call no.:
M23500/590
Type:
Conference Proceedings

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