Schrum, E.D., Reitz, T.L., Kung, H.H.
Elsevier
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Gines, M. J. L., Oh, H.-S., Xu, M., Hilmen, A.-M., Iglesia, E.
Elsevier
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R.S. Ferreira, R.R. Menezes, M.R. Morelli, R.H. Kiminami
American Institute of Chemical Engineers
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J. Zhou, X.Z. Lan, W.J. Luo, Y.H. Song, Q.L. Zhang
Trans Tech Publications
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R.S. Ferreira, R.R. Menezes, M.R. Morelli, R.H. Kiminami
American Institute of Chemical Engineers
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Wang, D., Ma, L., Jiang, C. J., Trimm, D. L., Wainwright, M. S., Kim, D. H.
Elsevier
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Hirano, M. (Japan), Akano, T. (Japan), Imai, T. (Japan), Kuroda, K. (Japan)
Elsevier
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Pereira, C., Krumpelt, M., Wilkenhoener, R., Ahmed, S.
American Institute of Chemical Engineers
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Stroes-Gascoyne, S., Johnson, L. H., Tait, J. C., McConnell, J. L., Porth, R. J.
MRS - Materials Research Society
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Dong Hyun Kim, Jietae Lee, Hyunchan Lee
American Institute of Chemical Engineers
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K. Minder, F. H. Teherani, D. Rogers, C. Bayram, R. McClintock, P. Kung, M. Razeghi
SPIE - The International Society of Optical Engineering
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Pietrzyk, S., Mahmoud, M. L. Ould Mohamed, Rembeczky, T., Bechara, R., Czernicki, M., Fatah, N.
Elsevier
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