Speir P. J., Gorman S. G., Amster J. I.
Kluwer Academic Publishers
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Easterling L/ M/, Amster J. I.
Kluwer
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Chen,C.H., Golovlev,V.V., Taranenko,N.I., Allman,S.L., Isola,N.R., Potter,N.T., Matteson,K.J., Chang,L.Y.
SPIE - The International Society for Optical Engineering
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Laukien, Frank H., Allemann, M., Bischofberger, P., Grossmann, P., Kellerhals, Hp., Kofel, P.
American Chemical Society
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McLafferty, Fred W., Amster, I. Jonathan, Furlong, Jorge J. P., Loo, Joseph A., Wang, Bing H., Williams, Evan R.
American Chemical Society
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Herritch R., Buchanan M.
Plenum Press
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C.H. Winston Chen, N.I. Taranenko, K. Tang, S.L. Allman
Society of Photo-optical Instrumentation Engineers
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Enjalbal, C., Maux, D., Combarieu, R., Martinez, J., Aubagnac, J-L.
Materials Research Society
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Chen,C.H.W., Taranenko,N.I., Zhu,Y.F., Allman,S.L., Tang,K., Matteson,K.J., Chang,L.Y., Chung,C.N., Martin,S., Haff,L.
SPIE-The International Society for Optical Engineering
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Steenvoorden M. J. J. R., Weeding L. T., Kistemaker G. P., Boon J. J.
Plenum Press
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Sherman, M. G., Kingsley, J. R., McIver, R. T., Jr., Hemminger, J. C.
American Chemical Society
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Holliman. C. L, Remepel. L. D, Gross. L. M
Kluwer Academic Publishers
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