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Investigation of deep levels in X-ray detector material with Photo Induced Current Transient Spectroscopy (PICTS)

Author(s):
Eiche, C.
Fiederle, M.
Wesse, J.
Maier, D.
Ebling, D.
Benz, K. W.
1 more
Publication title:
Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
302
Pub. Year:
1993
Page(from):
231
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558991989 [1558991980]
Language:
English
Call no.:
M23500/302
Type:
Conference Proceedings

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