Blank Cover Image

Ion Yield, Sputter Rate, and SIMS Matrix Effects in Quantitative Analysis of (AlxGa1-x)0.5N0.5

Author(s):
Publication title:
Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
510
Pub. Year:
1998
Page(from):
155
Pub. info.:
Warrendale, Pa: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994164 [1558994165]
Language:
English
Call no.:
M23500/510
Type:
Conference Proceedings

Similar Items:

Korgiaviy,A.P., Sigov,D.N., Bondarenko,G.G., Kucheriaviy,S.I.

Trans Tech Publications

BAR-NUN . A, HERMAN . G, RAPPAPORT . L . M, MEKLER . Yu

D. Reidel

Hastie, J.E., Jeon, C.W., Burns, D., Hopkins, J.-M., Calvez, S., Abram, R., Dawson, M.D.

SPIE-The International Society for Optical Engineering

Li, Z., Niu, H.

SPIE - The International Society of Optical Engineering

Fortalnova, E.A., Mosunov, A.V., Safronenko, M.G., Venskovskii, N.U., Politova, E.D.

Trans Tech Publications

Holcomb,M.O., Krames,M.R., Hofler,G.E., Carter-Coman,C., Chen,E.I., Grillot,P.N., Park,K., Gardner,N.F., Huang,J.-W., …

SPIE - The International Society for Optical Engineering

Cederberg, J. G., Bieg, B., Huang, J-W., Stockman, S. A., Peanasky, M. J.

MRS - Materials Research Society

Raymond, M. V., Al-Shareef, H. N., Tuttle, B. A., Dimos, D., Evans, J. T.

MRS - Materials Research Society

Kane, T. J., Smoliar, L. A., Adams, F., Arbore, M. A., Balsley, D. R., Byer, M., Conway, G., Grossman, W. M., Keaton, …

SPIE - The International Society of Optical Engineering

Mooney,P.M., Theis,T.N., Wright,S.L.

Trans Tech Publications

Z.Y. Zhang, L.M. Peng, X.Q. Zeng, L. Du, L. Ma, W.J. Ding

Trans Tech Publications

N. Tian, G. Zhao, C.M. Liu, L. Zuo

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12