Microstructural Correlation with Electrical Properties for Y2O3-Doped CeO2 Thin Films

Microstructural Correlation with Electrical Properties for Y2O3-Doped CeO2 Thin Films

Author(s):

Publication title:

Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

500

Pub. Year:

1998

Page(from):

279

Pub. info.:

Warrendale, PA: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994058 [155899405X]

Language:

English

Call no.:

M23500/500

Type:

Conference Proceedings

Details

TDL ID:	ZA00017061
Series ID:	PA00000011
Conf. info. (Name):	Symposium on electrically based microstructural characterization
Conf. info. (Number):	2nd
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1997.12.01-1997.12.04

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