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Conductance Transients Study of Slow Traps in Al/SiNx:H/Si and Al/SiNx:H/InP Metal-Insulator-Semiconductor Structures

Author(s):
Duenas, S.
Pelaez, R.
Castan, E.
Barbolla, J.
Martil, I.
Gonzalez-Diaz, G.
1 more
Publication title:
Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
500
Pub. Year:
1998
Page(from):
87
Pub. info.:
Warrendale, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558994058 [155899405X]
Language:
English
Call no.:
M23500/500
Type:
Conference Proceedings

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