Blank Cover Image

Combined Room Temperature Photoluminescence and High Resolution X-ray Diffraction Mapping of Semiconductor Wafers

Author(s):
Publication title:
Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
406
Pub. Year:
1996
Page(from):
555
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993099 [1558993096]
Language:
English
Call no.:
M23500/406
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings NEW ALGORITHMS FOR RAPID FULL-WAFER MAPPING BY HIGH RESOLUTION DOUBLE AXIS X-RAY DIFFRACTION

Loxley, N., Cockerton, S., Cooke, L. M., Gray, T., Tanner, B. K., Bowen, D. K.

MRS - Materials Research Society
7 Conference Proceedings High-Resolution X-ray Diffraction from Epitaxial Gallium Nitride Films

Lafford, T., Loxley, N., Tanner, B. K.

MRS - Materials Research Society
2 Conference Proceedings DOUBLE CRYSTAL SYNCHROTRON X-RAY DIFFRACTION STUDY OF STOICHIOMETRY IN GALLIUM ARSENIDE

Cockerton, S., Green G.S., Tanner, B.K.

Materials Research Society
8 Conference Proceedings A NEW TECHNIQUE FOR HIGH SPEED X-RAY DOUBLE CRYSTAL ROCKING CURVE ANALYSIS

Tanner, B.K., Xi, C., Bowen, D.K.

Materials Research Society
3 Conference Proceedings A GRAZING INCIDENCE X-RAY REFLECTOMETER FOR RAPID NONDESTRUCTIVE CHARACTERIZATION OF THIN FILMS AND INTERFACES

Loxley, N., Monteiro, A., Cooke, M. L.., Bowen, D. K., Tanner, B. K.

Materials Research Society
9 Conference Proceedings ROOM TEMPERATURE MEASUREMENT OF PHOTOLUMINESCENCE SPECTRA OF SEMICONDUCTORS USING AN FT-RAMAN SPECTROPHOTOMETER

Webb, J. D., Dunlavy, D. J., Ciszek, T., Ahrenkiel, R. K., Wanlass, M. W., Noufi, R., Vernon, S. M.

MRS - Materials Research Society
4 Conference Proceedings CHARACTERIZATION OF SUB-SURFACE STRUCTURES BY DOUBLE CRYSTAL X-RAY DIFFRACTION

Bowen, D. K., Hill, M. J., Tanner, B. K.

Materials Research Society
10 Conference Proceedings GRAZING INCIDENCE X-RAY REFLECTANCE MEASUREMENT OF SURFACE AND INTERFACE ROUGHNESS ON THE SUB-NANOMETRE SCALE

Wormington, M., Sakurai, K., Bowen, D. K., Tanner, B. K.

MRS - Materials Research Society
5 Conference Proceedings HIGH RESOLUTION X-RAY DIFFRACTION OF Hg1-XMnXTe EPITAXIAL FILMS

Tanner, B.K., Hallam, T.D., Funaki, M., Brinkman, A.W.

Materials Research Society
11 Conference Proceedings PRINCIPLES AND PERFORMANCE OF A PC-BASED PROGRAM FOR SIMULATION OF GRAZING INCIDENCE X-RAY REFLECTIVITY PROFILES

Wormington, M., Bowen, D. K., Tanner, B. K.

Materials Research Society
6 Conference Proceedings THERMAL DEGRADATION OF SiGe INTERFACES STUDIED BY X-RAY REFLECTIVITY AND DIFFRACTION

Hudson, , J. M., Powell, A. R., Bowen, D. K., Wormington, M., Tanner, B. K., Kubiak, R. A., Parker, E. H. C.

Materials Research Society
12 Conference Proceedings GRAZING INCIDENCE X-RAY REFLECTOMETRY STUDIES OF CADMIUM ARACHIDATE LANGMUIR-BLODGETT FILMS

Tanner, B. K., Bowen, D. K., Petty, M. C., Swaminathan, S., Grunfeld, F.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12