Optical Characterization of AlxGa1-xSb/GaSb Epitaxial Layers

Optical Characterization of AlxGa1-xSb/GaSb Epitaxial Layers

Author(s):

Lernia, S. di

Publication title:

Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

406

Pub. Year:

1996

Page(from):

389

Pub. info.:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558993099 [1558993096]

Language:

English

Call no.:

M23500/406

Type:

Conference Proceedings

Details

TDL ID:	ZA00017052
Series ID:	PA00000011
Conf. info. (Name):	Symposium on diagnostic techniques for semiconductor materials processing
Conf. info. (Number):	2nd
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1995.11.27-1995.11.30

Similar Items:

1 Conference Proceedings Photoreflectance investigation of InAs/GaAs self-assembled quantum dots grown by ALMBE Geddo, M., Ferrini, R., Guizzetti, G., Patrini, M., Franchi, S. MRS-Materials Research Society	7 Conference Proceedings Molecular Beam Epitaxy and Low-Dimensional Structures Franchi,S., Bosacchi,A. Trans Tech Publications
2 Conference Proceedings Optical study of strain-driven tuning of the emission energy in InAs/InGaAs quantum-dot nanostructures Geddo, M., Guizzetti, G., Bellani, V., Patrini, M., Ciabattoni, T., Seravalli, L., Frigeri, P., Minelli, M., Franchi, S. Electrochemical Society	8 Conference Proceedings Optical Analysis of Oxygen in Epitaxial Silicon Geddo M., Pivac B. Kluwer Academic Publishers
3 Conference Proceedings Optical characterization of hierarchically self-assembled GaAs/AlGaAs quantum dots Marabelli, F., Rastelli, A., Schmidt, O. G., Beaurin, G., Geddo, M., Guizzetti, G. Materials Research Society	9 Conference Proceedings MBE Growth and Characterization of InSb/AlxIn1-xSb Strained Layer Structures Goldammer, K. J., Liu, W. K., Ma, W., Santos, M. B., Hauenstein, R. J., O'Steen, M. L. MRS - Materials Research Society
4 Conference Proceedings Optical Characterization of Fullerite Single Crystals and Thin Films Patrini, M., Marabelli, F., Guizzetti, G., Manfredini, M., Castoldi, C., Milani, P. Electrochemical Society	10 Conference Proceedings MOVPE Growth and Characterization of AlxGa1-xN Layers on Sapphire Clur, S., Briot, O., Rouviere, J. L., Andenet, A., Vaillant, Y-M. Le, Gil, B., Aulombard, R. L., Demangeot, J. F., … MRS - Materials Research Society
5 Conference Proceedings PHOTOREFLECTANCE CHARACTERIZATION OF InGaAs LATTICE MATCHED TO InP Bellani, V., Amiotti, M., Geddo, M., Guizzetti, G., Landgren, G. MRS - Materials Research Society	11 Conference Proceedings Characterization of EL2 Level in As-Grown GaAs Prepared by MBE Smid,V., Hubik,P., Bosacchi,A., Franchi,S., Gombia,E., Vanzetti,L. Trans Tech Publications
6 Conference Proceedings Anisotropic Optical Response in β-FeSi2 Single Crystals and Thin Films Bocelli, S., Guizzetti, G., Marabelli, F., Parravicini, G. B., Patrini, M., Henrion, W., Lange, H., Tomm, Y. MRS - Materials Research Society	12 Conference Proceedings OBSERVATION OF SEMICONDUCTOR SUPERSTRUCTURES WITH BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON MICROSCOPY Bosacchi, A., Franchi, S., Govoni, D., Mattei, G., Merli, P. G., Migliori, A., Nacucchi, M. MRS - Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12