Near Field Scanning Optical Microscopy and Spectroscopy of Electronic Materials and Structures

Near Field Scanning Optical Microscopy and Spectroscopy of Electronic Materials and Structures

Author(s):: Duncan, W. M.
Publication title:: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
Title of ser.:: Materials Research Society symposium proceedings
Ser. no.:: 406
Pub. Year:: 1996
Page(from):: 183
Pub. info.:: Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:: 02729172
ISBN:: 9781558993099 [1558993096]
Language:: English
Call no.:: M23500/406
Type:: Conference Proceedings

Details

TDL ID:	ZA00017052
Series ID:	PA00000011
Conf. info. (Name):	Symposium on diagnostic techniques for semiconductor materials processing
Conf. info. (Number):	2nd
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1995.11.27-1995.11.30

Similar Items:

1 Conference Proceedings Fluorescence Lifetime Variations and Local Spectroscopy in Scanning Near-Field Optical Microscopy Pedarnig D. J., Specht M., Hansch W. T. Kluwer Academic Publishers	7 Conference Proceedings Ultrafast laser nanofabrication assisted with near-field scanning optical microscopy Wang, W., Hong, M.H., Wu, D., Goh, Y.W., Lin, Y., Luo, P., Luk'yanchuk, B.S., Lu, Y., Chong, T.C. SPIE - The International Society of Optical Engineering
2 Conference Proceedings Characterization of Materials and Devices by Near-Field Scanning Optical Microscopy Goldberg, B. B., Ghaemi, H. F., Unlu, M. S., Herzog, W. D. MRS - Materials Research Society	8 Conference Proceedings Fluorescence scanning near-field optical microscopy in reflection A. Jalocha, M.H.P. Moers, N.F. van Hulst Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings Biological applications of near-field scanning optical microscopy M.H.P. Moers, A.G.T. Ruiter, A. Jalocha, N.F. van Hulst, W.H.J. Kalle Society of Photo-optical Instrumentation Engineers	9 Conference Proceedings Near-field scanning optical microscopy probes for high-resolution beam scans of near-infrared lasers and waveguides Taylor,R.S., Leopold,K.E., Fraser,J.W., Feng,Y., Buchanan,M. SPIE - The International Society for Optical Engineering
4 Conference Proceedings Light Propagation in Scanning Near-Field Optical Microscopy Novotny L., Pohl W. D. Kluwer Academic Publishers	10 Conference Proceedings Fluorescence Microscopy and Spectroscopy by Scanning Near-Field Optical/Atomic Force Microscope(SNOM-AFM) Fujihira M. Kluwer Academic Publishers
5 Conference Proceedings Microvisualization Of Galvanic Corrosion Of Al 2024 With Confocal And Near-Field Scanning Optical Microscopies Guillaume, F., Garfias-Mesias, L.F., Buchler, M., Smyrl, W.H. Electrochemical Society	11 Conference Proceedings Scanning near-field optical microscopy, spectroscopy, and nanolithography [6180-81] Dryakhlushin, V. F. SPIE - The International Society of Optical Engineering
6 Conference Proceedings Surface electromagnetic waves in near-field optical scanning microscopy Pascual, M.F., Zierau, W., Leskova, T.A., Maradudin, A.A. SPIE	12 Conference Proceedings The Tetrahedral Tip as a Probe for Scanning Near-Field Optical and for Scanning Tunneling Microscopy Koglin J., Fischer C. U., Brzoska D. K., Gohde W., Fuchs H. Kluwer Academic Publishers

1

2

3

4

5

6

7

8

9

10

11

12