Blank Cover Image

EFFECT OF MECHANICAL STRESS ON ELECTROMIGRATION FAILURE MODE DURING ACCELERATED ELECTROMIGRATION TESTS

Author(s):
Pramanick, S.
Brown, D. D.
Pham, V,
Besser, P.
Sanchez, J.
Bui, N.
Hijab, R.
Yue, J. T.
3 more
Publication title:
Thin films, stresses and mechanical properties V : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
356
Pub. Year:
1995
Page(from):
507
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992573 [155899257X]
Language:
English
Call no.:
M23500/356
Type:
Conference Proceedings

Similar Items:

Brown, D. D., Sanchez, J. E., Jr., Pham, V., Besser, P. R., Korhonen, M. A., Li, C.-Y.

MRS - Materials Research Society

Thrasher,S., Capasso,C., Zhao,L., Hernandez,R., Mulski,P., Rose,S., Nguyen,T., Kawasaki,H.

SPIE-The International Society for Optical Engineering

Brown, D. D., Sanchez, J. E., Jr., Besser, P. R., Korhonen, M. A., Li, C.-Y.

MRS - Materials Research Society

Brotzen, F. R., Rosenmayer, C. T., Dunn, C. F., McPherson, J. W.

Materials Research Society

Besser, Paul R., Sanchez, John E., Jr., Field, David P., Pramanick, Shekhar, Sahota, Kashmir

MRS - Materials Research Society

Lloyd, J. R.

Materials Research Society

Besser, Paul R., Sanchez, John E., Jr., Field, David P., Pramanick, Shekhar, Sahota, Kashmir

MRS - Materials Research Society

Gall, M., Capasso, C., Thrasher, S., Zhao, L., Muiski, P., Hernandez, R., Herrick, M., Angyal, M., Boeck, B., Kawasaki, …

Electrochemical Society

Lloyd, J. R.

Materials Research Society

Bui, Nguyen D.

MRS - Materials Research Society

Brown, Dirk D., Besser, Paul R., Sanchez, John E., Jr., Korhonen, Matt A., Li, Che-Yu

MRS - Materials Research Society

Borgesen, P., Korhonen, M. A., Brown, D. D., Li. C. -Y.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12