TRENDS IN ATOMIC RESOLUTION ELECTRON MICROSCOPY

TRENDS IN ATOMIC RESOLUTION ELECTRON MICROSCOPY

Author(s):

Publication title:

Determining nanoscale physical properties of materials by microscopy and spectroscopy

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

332

Pub. Year:

1994

Page(from):

43

Pub. info.:

Pittsburgh, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558992313 [1558992316]

Language:

English

Call no.:

M23500/332

Type:

Conference Proceedings

Details

TDL ID:	ZA00017046
Series ID:	PA00000011
Conf. info. (Name):	Symposium on determining nanoscale physical properties of materials by microscopy and spectroscopy
Conf. info. (Number):	1993
Conf. info. (Venue):	Boston, Massachusetts, USA
Conf. info. (Date):	1993.11.29-1993.12.03

Similar Items:

1 Conference Proceedings IN SITU OBSERVATIONS OF BEAM-INDUCED EFFECTS DURING HIGH-RESOLUTION ELECTRON MICROSCOPY Smith, David J., Lu, Ping, McCartney, M.R., Sharma, R. Materials Research Society	7 Conference Proceedings Electron Microscopy at Atomic Resolution Gronsky, R. North-Holland
2 Conference Proceedings *ATOMIC RESOLUTION IMAGING OF SURFACES BY ELECTRON MICROSCOPY Smith, David, A. Materials Research Society	8 Conference Proceedings HIGH-RESOLUTION ELECTRON MICROSCOPY STUDIES OF Co/Cr MULTILAYERS Tsen, Shu-Chen Y., Stearns, Mary Beth, Smith, David J. Materials Research Society
3 Conference Proceedings Structural characterization of III-nitrides using electron microscopy D. J. Smith, L. Zhou, M. R. McCartney SPIE - The International Society of Optical Engineering	9 Conference Proceedings CHARACTERIZATION OF Mo/Si MULTILAYER STRUCTURES BY HIGH-RESOLUTION ELECTRON MICROSCOPY Chang, Chung-Hee, Stearns, Mary Beth, Smith, David J. Materials Research Society
4 Conference Proceedings Electron Microscopy of the Operation of Nanoscale Devices Cumings, John, Goldhaber-Gordon, David, Zettl, A., McCartney, M. R., Spence, J. C. H. Materials Research Society	10 Conference Proceedings Analysis of displacement and strain at the atomic level by high-resolution electron microscopy Hytch, M. J. Kluwer Academic Publishers
5 Conference Proceedings SURFACE STRUCTURES AND REARRANGEMENTS IN OXIDES McCartney, M. R., Smith, David J. Materials Research Society	11 Conference Proceedings In Situ Atomic Resolution Electron Microscopy of Metal-Mediated Crystallization of Semiconductors Konno,T.J., Sinclair,R. Trans Tech Publications
6 Conference Proceedings ATOMIC RESOLUTION ELECTRON MICROSCOPY OF BISMUTH CUPRATES Ramesh, R., Bagley, B.G., Tarascon, J.M., Hetherington, C.J.D., Thomas, G., Green, S.M., Luo, H.L. Materials Research Society	12 Conference Proceedings STRUCTURE DETERMINATION OF TILT BOUNDARIES IN GOLD BY HIGH RESOLUTION ELECTRON MICROSCOPY Krakow, William, Smith, David A. Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12