Parallelism of fault diagnosis for large-scale mechatronic systems

Parallelism of fault diagnosis for large-scale mechatronic systems

Author(s):

Li,J. ( Huazhong Univ.of Science and Technology )
Shi,T.
Wang,X.-C.
Yang,S.-Z.

Publication title:

International Conference on Intelligent Manufacturing

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2620

Pub. Year:

1995

Page(from):

347

Page(to):

352

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420121 [0819420123]

Language:

English

Call no.:

P63600/2620

Type:

Conference Proceedings

Details

TDL ID:	ZA00017002
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Intelligent Manufacturing
Conf. info. (Number):	1995
Conf. info. (Venue):	Wuhan, China
Conf. info. (Date):	1995.06.14-1995.06.17

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