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Development of automatic discriminating approach of process condition for FMC condition monitoring and fault diagnosis

Author(s):
Publication title:
International Conference on Intelligent Manufacturing
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2620
Pub. Year:
1995
Page(from):
327
Page(to):
332
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420121 [0819420123]
Language:
English
Call no.:
P63600/2620
Type:
Conference Proceedings

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