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Microstructural observation of short-wavelength recorded spots of phase-change thin film by atomic force microscopy

Author(s):
Men,L. ( Shanghai Institute of Optics and Fine Mechanics (China) )
Liu,H. ( Shanghai Institute of Optics and Fine Mechanics (China) )
Jiang,F. ( Shanghai Institute of Optics and Fine Mechanics (China) )
Gan,F. ( Shanghai Institute of Optics and Fine Mechanics (China) )
Sun,J. ( Shanghai Institute of Nuclear Research (China) )
Li,M. ( Shanghai Institute of Nuclear Research (China) )
1 more
Publication title:
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3175
Pub. Year:
1998
Page(from):
47
Page(to):
53
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819426734 [0819426733]
Language:
English
Call no.:
P63600/3175
Type:
Conference Proceedings

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