Train-by-show in color-based assembly and packaging inspection

Author(s):

McConnell,R.K. ( Wayland Research )  

Publication title:

Machine Vision Applications, Architectures, and Systems Integration VI

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3205

Pub. Year:

1997

Page(from):

210

Page(to):

217

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819426376 [0819426377]

Language:

English

Call no.:

P63600/3205

Type:

Conference Proceedings