X-ray agricultural product inspection: segmentation and classification

X-ray agricultural product inspection: segmentation and classification

Author(s):

Casasent,D.P. ( Carnegie Mellon Univ. )
Talukder,A. ( Carnegie Mellon Univ. )
Lee,H.-W. ( Dongyang Univ.(Korea) )

Publication title:

Machine Vision Applications, Architectures, and Systems Integration VI

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3205

Pub. Year:

1997

Page(from):

46

Page(to):

55

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819426376 [0819426377]

Language:

English

Call no.:

P63600/3205

Type:

Conference Proceedings

Details

TDL ID:	ZA00016932
Series ID:	PA00000029
Conf. info. (Name):	Intelligent Systems and Advanced Manufacturing : Machine Vision Applications, Architectures, and Systems Integration
Conf. info. (Number):	1997 : 6th
Conf. info. (Venue):	Pittsburgh, PA, USA
Conf. info. (Date):	1997.10.15-1997.10.16

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