Self-heating as a tool for measuring sub-0.1-ヲフm silicon-on-insulator device parameters
- Author(s):
- Osman,M.A. ( Washington State Univ. )
- Osman,A.A. ( Washington State Univ. )
- Publication title:
- Ultrafast Phenomena in Semiconductors II
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3277
- Pub. Year:
- 1998
- Page(from):
- 266
- Page(to):
- 272
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819427168 [0819427160]
- Language:
- English
- Call no.:
- P63600/3277
- Type:
- Conference Proceedings
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