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Optoelectronic morphological processor for industrial online inspection

Author(s):
  • Liu,H. ( Tsinghua Univ.(China) )
  • Wu,M. ( Tsinghua Univ.(China) )
  • Jin,G. ( Tsinghua Univ.(China) )
  • Cheng,G. ( Tsinghua Univ.(China) )
  • He,Q. ( Tsinghua Univ.(China) )
Publication title:
Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3306
Pub. Year:
1998
Page(from):
141
Page(to):
148
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427465 [0819427462]
Language:
English
Call no.:
P63600/3306
Type:
Conference Proceedings

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