Blank Cover Image

Electrical Characterisation of Schottky Junctions: Anomalies,Parameter Extraction and Barrier Height Engineering

Author(s):
Horvath,Zsolt J.  
Publication title:
Physics of - Semiconductor Devices -
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3316
Pub. Year:
1998
Vol.:
Part 2
Page(from):
1085
Page(to):
1092
Pub. info.:
New Delhi: Narosa Publishing House
ISSN:
0277786X
ISBN:
9780819427564 [081942756X]
Language:
English
Call no.:
P63600/3316
Type:
Conference Proceedings

Similar Items:

Horvath,Zs.J., Tuyen,V.V.

SPIE-The International Society for Optical Engineering

Ota, C., Nishio, J., Hatakeyama, T., Shinohe, T., Kojima, K., Nishizawa, S., Ohashi, H.

Trans Tech Publications

Horvath, Zs. H.

Materials Research Society

Waldrop, J. R., Grant, R. W.

Materials Research Society

Yen-Chu Yang, Yoshifumi Nishi, Atsuhiro Kinoshita

Materials Research Society

C.D. Tan, C. Chua, D. Chi

Electrochemical Society

Hunt, B.D., Schowalter, L.J., Lewis, N., Hall, E.L., Hauenstein, R.J., Schlesinger, T.E., McGill, T.C., Okamoto,Masako, …

Materials Research Society

Kovacz, B., Horvath, Zs. J., Mojzes, I., Molnar, G., Peto, G., Andrasi, M

Materials Research Society

Moscatelli, F., Scorzoni, A., Poggi, A., Cardinali, G.C., Nipoti, R.

Trans Tech Publications

Tung, R. T., Sullivan, J. P., Schrey, F.

MRS - Materials Research Society

L. Hutin, C. Le Royer, C. Tabone, V. Carron, V. Delaye

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12