Xie, P., Liu, W., Liu, C., Yu, Y., Volkerman, R., Fu, Q., Mettendorf, K. U., Platt, U.
SPIE - The International Society of Optical Engineering
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Scott. T. Lawrence
Kluwer Academic Publishers
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Lessard, R. B., Wallace, M. M., Oertling, W. A., Chang, C. K., Berglund, K. A., Nocera, D. G.
Materials Research Society
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Newsham, M.D., Cerreta, M.K., Berglund, K.A., Nocera, D.G.
Materials Research Society
|
Houlihan, F., Sakamuri, R., Hamilton, K., Dimerli, A., Rentkiewicz, D., Romano, A., Dammel, R. R., Wei, Y., Stepanenko, …
SPIE - The International Society of Optical Engineering
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A. Fishman, Y. Tao, W.E. Bentley, T.K. Wood
American Institute of Chemical Engineers
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Harvey, Ronald G., Dai, Qing, Ran, Chongzhao, Penning, Trevor M.
American Chemical Society
|
A. Fishman, Y. Tao, W.E. Bentley, T.K. Wood
American Institute of Chemical Engineers
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Pellequer,Jean-Luc, Chen,Shu-wen W., Feeney,Ann J., Zhao,Bitao, Kao,Hui-I, Karu,Alexander E., Li,Kai, Li,Qing X., …
American Chemical Society
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Dinur T., Osiecki-Newman M. K., Fabbro T. D., Legler G., Gatt S., Desnick J. R., Grabowski A. G.
Plenum Press
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Mysov, V. M., Ione, K. G.
Elsevier
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Hall, W. K., Engelhardt, J., Sill, G. A.
Elsevier
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