Blank Cover Image

Quantitative analysis of SlLCs(stress-induced leakage currents)based on the inelastic trap-assisted tunneling model

Author(s):
Kamohara,S. ( Hitachi Ltd. )
Okuyama,Y.
Manabe,Y.
Okuyama,K.
Kubota,K.
Park,D.
Hu,C.
2 more
Publication title:
Microelectronic Device Technology III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3881
Pub. Year:
1999
Page(from):
206
Page(to):
214
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819434784 [0819434787]
Language:
English
Call no.:
P63600/3881
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Stress-Induced Leakage Current in Magnetic Tunnel Junctions with Thin AlOx Barrier

T. Mihara, Y. Kamakura, M. Morifuji, K. Taniguchi

Electrochemical Society
7 Conference Proceedings Phase Field Modeling of Surface Instabilities Induced by Stresses

Seol, D.J., Hu, S.Y., Liu, Z.K., Kim, S.G., Kim, W.T., Oh, K.H., Chen, L.Q.

Materials Research Society
2 Conference Proceedings Two-Band Tunneling Currents and Stress-Induced Leakage in Ultrathin SiO2 Films

Okhonin, S., Ils, A., Bouvet, D., Fazan, P., Guegan, G., Deleonibus, S., Martin, F.

MRS - Materials Research Society
8 Conference Proceedings Tunneling Current Through MIS Structures With Ultra-Thin Insulators

Fujioka, H., Wann, H-J., Park, D-G., King, Y-C., Chyan, Y-F., Oshima, M., Hu, C.

MRS - Materials Research Society
3 Conference Proceedings Improvement of leakage current and optical properties of GaN-based LEDs by chemical etching of p-GaN

T.-Y. Park, C.-H. Cho, I.-K. Park, S.-J. Park

Society of Photo-optical Instrumentation Engineers
9 Conference Proceedings A New Poly-Si YFTs with Low Leakage Current*

Han, M.-K., Park, C.-M.

Electrochemical Society
4 Conference Proceedings Stress-induced leakage currents of silicon oxides in flash EEPROM transistor

Kang, C.S.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Analysis of High Leakage Currents in 4H-SiC Schottky Barrier Diodes Using Optical Beam-Induced Current Measurements

Tsuji, T., Izumi, S., Ueda, A., Fujisawa, H., Ueno, K., Tsuchida, H., Kamata, I., Jikimoto, T., Izumi, K.

Trans Tech Publications
5 Conference Proceedings Reduction of Substrate Leakage Current by Minimizing Trench-isolation- Induced Stress

Miura, H., Ishitsuka, N., Suzuki, N., Ohyu, K., Ikeda, S.

Electrochemical Society
11 Conference Proceedings Analysis of High Leakage Currents in 4H-SiC Schottky Barrier Diodes Using Optical Beam-Induced Current Measurements

Tsuji, T., Izumi, S., Ueda, A., Fujisawa, H., Ueno, K., Tsuchida, H., Kamata, I., Jikimoto, T., Izumi, K.

Trans Tech Publications
6 Conference Proceedings Proton-induced leakage current in CCDs

Smith, D.R., Holland, A.D., Robbins, M.S., Ambrosi, R.M., Hutchinson, I.B.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Reduction in leakage current of InGaN-based light-emitting diodes by N2O plasma passivation

Kim, H.-M., Huh, C., Park, S.-J.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12