Blank Cover Image

Theory & Modeling and Realizing of Integrated Neural Networks in Fault Diagnosis,#132

Author(s):
Publication title:
Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3727
Pub. Year:
1999
Vol.:
Part2
Page(from):
2025
Page(to):
2030
Pub. info.:
Bethel, CT: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780912053646 [091205364X]
Language:
English
Call no.:
P63600/3727
Type:
Conference Proceedings

Similar Items:

Fan, L.T., Su, H.B.

American Institute of Chemical Engineers

Powell, S., Magnotta, V., Johnson, H., Andreasen, N.

SPIE - The International Society of Optical Engineering

S. Barua

Society of Photo-optical Instrumentation Engineers

F. Zhou, H. Xu, J. Yu, J. Liu

Society of Photo-optical Instrumentation Engineers

Wang, Xin, Xu, Juan, Zhang, Guo Dong, Qi, Rui Min

Trans Tech Publications

Zhang, Hao Qian

Trans Tech Publications

Z. You, X. Zhang, S. Yu, H. nan

Society of Photo-optical Instrumentation Engineers

Cong, Wei, Jing, Bo, Yu, Hong Kun

Trans Tech Publications

S. Kang, Y. Kang, J. Chen

Society of Photo-optical Instrumentation Engineers

Cong, Wei, Jing, Bo, Yu, Hong Kun

Trans Tech Publications

J. Hu, G. Li, S. Jia

Society of Photo-optical Instrumentation Engineers

Wang, Jiang Ping, Lin, Shun De, Bao, Ze Fu

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12