Blank Cover Image

Assessment of Localized Damage in Beam Structures Using Limited Modal Characteristics,#236

Author(s):
Publication title:
Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3727
Pub. Year:
1999
Vol.:
Part2
Page(from):
2011
Page(to):
2017
Pub. info.:
Bethel, CT: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780912053646 [091205364X]
Language:
English
Call no.:
P63600/3727
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Damage characterization of SiN x-ray mask membrane caused by electron-beam exposure

Choi,S.-S., Jeon,Y.J., Kim,J.-S., Chung,H.B., Lee,S.Y., Lee,J.H., Yoo,H.J.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Characteristics of ZrO2/Al2O3 Bilayer Film for Gate Dielectric Applications Deposited by Atomic Layer Deposition Method

Kim, Y.D., Lee, J.H., Koo, J.H, Chang, H.J., Jeon, H.T.

Trans Tech Publications
2 Conference Proceedings A basic study on structure damage assessment by quantitative damage detectiion [6041-84]

Kim B. -J, Han S. -H, Ryu J. -D, Yuk K. -C, Tae S.-H, Hong D. -P

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Capacitance-type Alcohol Gas Sensors Using Porous Silicon Layer Measurable at Room Temeperature

Kim, S.-J., Jeon, B-H., Choi, K-S.

Electrochemical Society
3 Conference Proceedings EUV microexposures at the ALS using the 0.3-NA MET projection optics

Jeon, Y.-D., Choi, M.-K., Kim, E.-J., Kim, J.-S., Oh, H.-K.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Characteristics of reflection-type HOEs measured visually

Son,J.-Y., Smirnov,V.V., Jeon,H.-W., Kim,J.-S., Choi,Y.-J., Chun,Y.-S.

SPIE - The International Society for Optical Engineering
4 Conference Proceedings KAIST image computing system(KICS):a parallel architecture for real-time multimedia platform using multiple MVPs(TMS320C80)

Jeon,J., Choi,G., Kim,H., Kim,J., Park,H.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Characteristics of the HfO₂ Thin Films Grown by Remote Plasma Atomic Layer Deposition Method on the Plasma Oxidized Si Substrate

H. Kong. S. Kim, J. Kim, J. Choi, H. Jeon, C. Bae

Electrochemical Society
5 Conference Proceedings Electronic structure of chromium aluminum oxynitride by DV-Xa method and photoelectron spectroscopy

Choi, Y., Chang, H., Lee, J.D., Kim, E., No, K.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Structural Characteristics Of Carbon Nanorods and Nanotubes Grown Using Electron Cyclotron Resonance Chemical Vapor Deposition

Woo, Y. S., Han, I. T., Park, Y. J., Kim, H. J., Jung, J. E., Lee, N. S., Jeon, D. Y., Kim, J. M.

Materials Research Society
6 Conference Proceedings Contact Modeling Technique of a Flexible Piston and Cylinder Using Modal Synthesis Method

W. K. Kim, S. H. Sohn, H. J. Cho, D. S. Bae, J. H. Choi

American Society of Mechanical Engineers
12 Conference Proceedings Fatigue Damage Model for Numerical Assessment of Fatigue Characteristics

C.S. Lee, M.H. Kim, M.S. Chun, T.K. Lee, J.M. Lee

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12