Damage Identification with Linear Discriminant Operators,#200

Damage Identification with Linear Discriminant Operators,#200

Author(s):

Farrar,C.R. ( Los Alamos National Laboratory )
Nix,D.A.
Duffey,T.
Cornwell,P.J.
Pardoen,G.C.

Publication title:

Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3727

Pub. Year:

1999

Vol.:

Part1

Page(from):

599

Page(to):

607

Pub. info.:

Bethel, CT: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780912053646 [091205364X]

Language:

English

Call no.:

P63600/3727

Type:

Conference Proceedings

Details

TDL ID:	ZA00016680
Series ID:	PA00000029
Conf. info. (Name):	International Modal Analysis Conference
Conf. info. (Number):	17th
Conf. info. (Venue):	Kissimmee, FL, USA
Conf. info. (Date):	1999.02.08-1999.02.11

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